Location: First floor and Lower Level, Physics Research Building, 191 West Woodruff Avenue, Columbus, Ohio 43210
Contact: Dr. Denis V. Pelekhov, Lab Manager, email@example.com, 614-292-9125
NanoSystems Laboratory (NSL) provides users with access to advanced material characterization and fabrication tools for research and development applications. NSL operates a diverse set of research instrumentation and research capabilities including Focused Ion Beam/Scanning Electron Microscopy, X-ray diffractometry, SQUID magnetometry, Atomic Force/Magnetic Force microscopy, EDS X-ray microanalysis, Langmuir-Blodgett trough monolayer deposition, e-beam lithography, Electron Spin Resonance spectroscopy, Physical Vapor material deposition, ion milling, maskless photo lithography, Low‐Temperature/High Magnetic field magnetotransport measurements, diamond CVD growth, material polishing, Kerr microscopy, THz spectroscopy, critical point drying and magneto-optical material studies. NSL also operates two 1,600 ft2 clean room facilities. One clean room houses instruments for material deposition and photo lithography, while the other clean room is devoted to processing organic spintronics devices, organic photovoltaics, organic LEDs, and other air and moisture sensitive materials. It is equipped with four interconnected gloveboxes with Ar and N2 atmosphere. Equipment installed in the gloveboxes includes an organic deposition chamber, metal deposition chamber, parylene deposition system, a spin coater, a solar simulator, wiring station and a system for electrical testing.
- Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) – FEI Helios Nanolab 600 Dual Beam sophisticated platform for sample preparation, imaging and analysis. High-performance ion column, Platinum deposition, X-ray EDS microanalysis and custom e-beam lithography.
- 2 SQUID Magnetometers – One Quantum Design MPMS system and one MPMS XL system for magnetic sample characterization. A very sensitive tool for measuring DC sample magnetic moment.
- 2 Atomic Force/Magnetic Force Microscopes (AFM/MFM) – One Bruker Dimension Icon and one Dimension 3000 Scanning Probe Microscope.
- Langmuir-Blodgett Trough (LBT) – NIMA Technology model 612D trough used for studying properties of monolayers of amphiphilic molecules and for depositing molecular monolayers on various substrates.
- X-Ray Diffractometer (XRD) – Bruker D8 Discover high-resolution triple-axis X-ray diffractometer with high performance optics for optimum resolution.
- Low-Temperature Magnetotransport Measurement System (LTMT) – Can be used to measure electrical properties of materials and devices at low temperatures and in magnetic field
- Lab-18 Thin Film Deposition system installed in a clean room environment with RF and DC sputtering and e-beam deposition capabilities. Optimized for sputter deposition of magnetic metals and/or oxides followed by coating with a precious metal (gold, platinum, etc.) using e-beam deposition.
- 14 T Physical Properties Measurement System (PPMS) with a cryogenic Atomic Force Microscope/Magnetic Force Microscope (AFM/MFM).
- Diamond Chemical Vapor Deposition System (CVD) for synthesizing high quality poly crystalline and single crystal diamond films for research and production.
- Other available instruments include a Wire Bonder, a Critical Point Dryer, two Terahertz spectrometers, a Magneto-optical Kerr Microscope, and a new optical microscope.
- New instruments available soon include an Electron Paramagnetic Resonance (EPR) spectrometer, and a laser writer for mask-free photo lithography installed in a clean room environment.