Surface Analysis Facility



Contact: Dr. Lisa Hommel, Lab Manager, 614-292-2760,  


The Surface Analysis Facility is a research facility within the department of Chemistry which provides training in and access to scanning electron microscopy, atomic force microscopy, and x-ray photoelectron spectroscopy (XPS) – also called electron spectroscopy for chemical analysis (ESCA).

Available Instrumentation

  • Kratos Axis Ultra x-ray photoelectron spectroscope (XPS) equipped with both monochromated (Al) and dual (Mg and Al) x-ray guns, a helium UV source to provide UPS and an Ar ion gun to provide depth profiling
  • Dry-box for XPS sample preparation – A dry-box is provided for sample mounting in an oxygen/water free environment. There is a removable chamber attached to the dry-box which may be fitted to our current XPS instrument.
  • JEOL JSM-5500 scanning electron microscope (SEM); an Au coater is available for SEM sample preparation
  • Veeco Icon Dimension atomic force microscope (AFM)

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