NanoSystems Laboratory (NSL)

Location: First floor and Lower Level, Physics Research Building, 191 West Woodruff Avenue, Columbus, Ohio 43210

Website: http://ensl.osu.edu/

Contact: Dr. Denis V. Pelekhov, Lab Manager, pelekhov.1@osu.edu, 614-292-9125

Download the NSL flyer 

Description

NanoSystems Laboratory (NSL) is a campus-wide user facility providing the OSU material science community with cutting-edge characterization equipment. The instruments available at NSL include, but are not limited to:  a state-of-the-art dual beam Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) with capabilities for electron beam lithography, in situ nanomanipulation, and EDS X-ray microanalysis, a high-resolution triple axis X-ray Diffractometer, two Superconducting Quantum Interference Device (SQUID) Magnetometers, two Atomic Force/Magnetic Force Microscopes (AFM/MFM), a new Chemical Vapor Deposition System for diamond growth, three Physical Property Measurement Systems (PPMS) for high-magnetic-field electric and magnetic measurements, one of which has a PPMS-compatible cryogenic AFM/MFM, two Terahertz Spectrometers, an Electron Paramagnetic Resonance Spectrometer, and a rapid turnaround system for  low-temperature magnetotransport measurements. In addition, NSL operates a Class 1000 clean room with instruments such as a Langmuir-Blodgett trough for molecular monolayer deposition, a combined magnetron sputtering/electron beam thin film deposition system, and a laser writer for mask-free photo lithography.

Available Instrumentation

  • Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) – FEI Helios Nanolab 600 Dual Beam sophisticated platform for sample preparation, imaging and analysis. High-performance ion column, Platinum deposition, X-ray EDS microanalysis and custom e-beam lithography.
  • 2 SQUID Magnetometers – One Quantum Design MPMS system and one MPMS XL system for magnetic sample characterization. A very sensitive tool for measuring DC sample magnetic moment.
  • 2 Atomic Force/Magnetic Force Microscopes (AFM/MFM) – One Bruker Dimension Icon and one Dimension 3000 Scanning Probe Microscope.
  • Langmuir-Blodgett Trough (LBT) – NIMA Technology model 612D trough used for studying properties of monolayers of amphiphilic molecules and for depositing molecular monolayers on various substrates.
  • X-Ray Diffractometer (XRD) – Bruker D8 Discover high-resolution triple-axis X-ray diffractometer with high performance optics for optimum resolution.
  • Low-Temperature Magnetotransport Measurement System (LTMT) – Can be used to measure electrical properties of materials and devices at low temperatures and in magnetic field
  • Lab-18 Thin Film Deposition system installed in a clean room environment with RF and DC sputtering and e-beam deposition capabilities. Optimized for sputter deposition of magnetic metals and/or oxides followed by coating with a precious metal (gold, platinum, etc.) using e-beam deposition.
  • 14 T Physical Properties Measurement System (PPMS) with a cryogenic Atomic Force Microscope/Magnetic Force Microscope (AFM/MFM).
  • Diamond Chemical Vapor Deposition System (CVD) for synthesizing high quality poly crystalline and single crystal diamond films for research and production.
  • Other available instruments include a Wire Bonder, a Critical Point Dryer, two Terahertz spectrometers, a Magneto-optical Kerr Microscope, and a new optical microscope.
  • New instruments available soon include an Electron Paramagnetic Resonance (EPR) spectrometer, and a laser writer for mask-free photo lithography installed in a clean room environment.

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